1.3. Wafer Reject Criteria
Pass/fail parameters are measured on nine (or more) sites, distributed uniformly across the wafer.
At least 2/3 of the measured sites (min. 6 sites) must pass all pass/fail criteria in order to consider the tested wafer as pass.
Please refer to the following example. In reality about 50 tests are included.
Figure 1.3 Examples for Pass/Fail IHP-Wafers