1.3. Wafer Reject Criteria

Pass/fail parameters are measured on nine (or more) sites, distributed uniformly across the wafer.

At least 2/3 of the measured sites (min. 6 sites) must pass all pass/fail criteria in order to consider the tested wafer as pass.

Please refer to the following example. In reality about 50 tests are included.

Wafer Reject Criteria

Figure 1.3 Examples for Pass/Fail IHP-Wafers