1. General

1.1. Purpose

This document describes layout devices for IHPs SG13G2 SiGe BiCMOS technology.

Please refer to the List of abbreviations in the layout rules section for further details.

Note

Various device definitions require derived layers instead of the original layers. The generation rules for the derived layers are described below.

Derived Layers
Layer name	Definition
PWell	NOT (NWell OR PWell:block) OR PWell:drawing
nSD	NOT (pSD OR nSD:block) OR nSD:drawing
NWell_tie	(Activ AND nSD) inside NWell
NWell_holes	(HOLES NWell_tie) Not NWell
substrate_tie (ptap)	(Activ AND pSD) inside PWell
ptap_holes	HOLES substrate_tie
ntap	(Activ AND nSD) inside NWell
ntap_holes	HOLES ntap
ContBar	Any Cont shape not being a square shape is considered a ContBar.

The following figure illustrates the NWell_holes/Ptap_holes layers mentioned in the preceding table.

Figure 1.3.1 Nwell-Holes derived layer

Tip

Refer to the layout layers section for information about drawing layer colors.

The following table provides definitions for terms that will be used in the upcoming sections:

Glossary of Terms
Term	Definition
Description	Brief explanation or summary of the device or parameter.
Device Recognition	Refers to the essential layers used to identify the device within a design.
Model Name	The specific name assigned to the device, which is recognized and used within the netlist.
Layout Cell Name	The name given to the layout cell representing the device in the sg13g2_pr gds layout file.
Parameters	A list of all configurable parameters that can be applied to the device.
Netlist Syntax	The specific syntax or format used to represent the device within a netlist, typically including the device name and its associated parameters.
Additional Notes	Any additional information or special considerations relevant to the device.
Schematic-View	Indicates whether the parameter is available in the schematic view.
LVS-View	Indicates whether the parameter is available in a Layout versus Schematic (LVS) view.
LVS-Comparison	Indicates whether the parameter is included in the comparison process during Layout versus Schematic (LVS) checking.